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Optical reflectance of nanostructured silicon fabricated by metal-assisted chemical etching at ammonia adsorption
Authors:
- Igor Iatsunskyi,
- V.A. Smyntyna,
- N.N. Pavlenko,
- O.V. Sviridova,
- O.A. Rimashevskyi
Abstract
The optical reflectance of various nanosilicon structures after ammonia adsorption were investigated. It was shown that increasing of ammonia concentration in the measurement chamber leads to an increase of the reflectance. © OSA 2013.
- Record ID
- UAM04cc82b3fa0a44a4a19eb57e9b21c52e
- Author
- Journal series
- Optics InfoBase Conference Papers, ISSN , e-ISSN 2162-2701
- Issue year
- 2013
- Language
- (en) English
- Score (nominal)
- 0
- Score source
- journalList
- Score
- Publication indicators
- = 0
- Uniform Resource Identifier
- https://researchportal.amu.edu.pl/info/article/UAM04cc82b3fa0a44a4a19eb57e9b21c52e/
- URN
urn:amu-prod:UAM04cc82b3fa0a44a4a19eb57e9b21c52e
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